Quality & Reliability

In defense procurement, reliability is proven by equipment and process, not by a line in a brochure.

Design through production, one roof

Semiconductor IP design, product design, SMT assembly and test all happen in-house. Whether a fault sits in the controller or in the assembly, the same team traces it.

Domestic design, dependable supply chain

The core design assets are held in Korea, so a foreign vendor’s end-of-life notice or an export-control decision does not dictate the schedule. In defense procurement, continuity of supply is reliability.

Long-term supply

From the 2005 PATA SSD onward we keep shipping interfaces the market abandoned. Legacy support is a commitment, not a leftover.

ISO 9001:2015 / KS Q ISO 9001:2015 certificate — PaxDisk Co., Ltd., issued by Ace Certification

Certification

ISO 9001:2015 quality management system

PaxDisk was certified to ISO 9001 / KS Q ISO 9001 in September 2013 and has run the whole storage-device manufacturing process under a documented quality system ever since.

StandardISO 9001:2015 / KS Q ISO 9001:2015
ScopeManufacture of storage devices, photoelectric amplifier modules and current sensor modules
First certified13 September 2013
Certification bodyAce Certification (JAS-ANZ · IAF MLA)

Environmental

Defense-grade environmental specification

The figures below apply across the PaxDisk SSD line-up.

Environmental specification
ItemSpecificationNote
Operating temperature -40°C ~ +85°C Common to the defense and industrial grades. Custom builds go down to -60°C.
Shock 1,500G, 0.5ms Common to the whole line-up.
Vibration 16.32G rms Common to the whole line-up.
Altitude -1,200 ~ 120,000ft Common to the whole line-up.
Humidity 5% ~ 95% Common to the whole line-up.

Per-product environmental figures are on each product page. Test reports are shared, within the limits we are permitted, alongside a quotation or technical enquiry.

Infrastructure

Test & production infrastructure

Every item below is real equipment recorded in the company timeline.

2008

Thermal shock chamber

In-house verification of the -40°C to +85°C defense-grade temperature range.

2009

SMT line

Design through assembly in-house, keeping the supply chain short.

2010

20GHz-class measurement equipment

Direct signal-integrity measurement for high-speed serial interfaces (SATA 6Gbps, PCIe).

2009

Corporate R&D institute

Founded 2009; runs both semiconductor IP design and product development.

Lab & Measurement

Test & measurement equipment

From device characterisation (I-V, LCR) through RF spectrum and 20 GHz TDR to SATA-class high-speed serial compliance — we own the instruments needed to measure what we design.

High-speed serial

High-speed serial & compliance

Signal integrity and standards compliance of high-speed serial interfaces such as SATA are tested in-house. The company that designed the interface IP measures the signal itself.

DSA71604 illustration

Tektronix

DSA71604

16 GHz real-time digital serial analyser — eye diagrams, jitter decomposition, serial bus compliance analysis

AWG7102 illustration

Tektronix

AWG7102

10 GS/s arbitrary waveform generator — receiver (RX) tolerance testing with stressed signals and injected jitter

TDS8000B + 80E04 · 80A05 illustration

Tektronix

TDS8000B + 80E04 · 80A05

Sampling oscilloscope — impedance and transmission-line characterisation on a 20 GHz TDR module, plus 10G-class clock-recovery eye analysis

RF · Spectrum

RF & spectrum

Clock harmonics and radiated components are checked while the design is still on the bench.

HP 8566B illustration

Hewlett-Packard

HP 8566B

22 GHz spectrum analyser — RF spectrum, clock harmonics, pre-compliance EMI checks

Device-level

Device-level characterisation

Measurement starts at the device, not the board — the starting point for component screening and failure analysis.

HP 4145B illustration

Hewlett-Packard

HP 4145B

Semiconductor parameter analyser — I-V characterisation of transistors and diodes

E4980AL illustration

Keysight

E4980AL

Precision LCR meter — impedance and C-V characterisation of passives and semiconductors

Measurement requests and test-scope discussions come through the quote request form. The instruments and the test environment can be seen on a site visit.

Need test data or a datasheet?

Tell us the standard and the application, and we will confirm what we can release.